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NIFT MFM Exam Analyser | Details on NIFT-MFM Exam, Syllabus, Exam Analysis, Cut offs, Tips and more |
NIFT MFM Question Bank with Self Assessor | More than 50000 questions subjectwise, topicwise, chapterwise with facilty to create your own test based of parameters - 180 Subject & Chapter Tests (Per Month) for NIFT MFM Entrance Exam |
NIFT MFM Mock Tests with Test Simulator | - 15 Complete Mock Tests (Per Month) for NIFT MFM Entrance Exam |
NIFT MFM Report and Analytics | Test History for each attempted NIFT-MFM test with individual analytics |
NIFT MFM Comparative Study | NIFT MFM Mock Tests taken are compared with Toppers and Average Students |
Number of Test Per Day (12 Tests) | Self Assessor/Topic Tests - 6 Tests Test Simulator/Mock Tests - 6 Tests |
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NIFT MFM 2024 EXAM PATTERN
Conquering the NIFT MFM 2024 entrance exam requires mastering two distinct stages: written tests and the Situation Test/Personal Interview. Let's dive into the details of each stage, equipping you with the knowledge to navigate this crucial step toward your fashion management dream.
Master of Fashion Technology |
GAT (Weightage-70%) |
PI (Weightage-30%) |
NIFT GAT 2024 Exam Pattern - M.F.M
Program |
MFM |
Paper |
GAT |
Language of written test |
English/Hindi |
Duration |
180 minutes |
Sections |
Number of questions |
Communication Ability & English Comprehension |
50 |
Case Study |
40 |
Quantitative Ability |
10 |
Analytical & Logical Ability |
25 |
General Knowledge And Current Affairs |
25 |
TOTAL |
150 |
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COMPONENTS OF THE GENERAL ABILITY TEST (for all programmes)
i) Quantitative Ability: This sub-test is designed to test the quantitative ability of the candidates. The sub test consists of questions on Addition, Multiplication, Division, Fractions, Percentage, Rate of Interest, Work and Task, Ratio and Proportion and Distance.
ii) Communication Ability and English Comprehension: This subtest is aimed at testing the language ability of the candidates in day to day communication. It includes questions on synonyms, antonyms, words with corresponding meanings, singular, plural, one word substitutes, idioms and phrases, correct spellings, comprehend a situation from a given passage etc.
iii) Analytical Ability and Logical Ability: This sub-test is designed to test the candidate’s capacity for inference and logic from the given information and to evaluate the candidate’s ability to identify the given problem and apply reasoning in solving the core issues of the problem. Concepts and practice of creative and lateral thinking are likely to be useful.
iv) General Knowledge and Current Affairs: This sub-test is designed to test the candidate’s general knowledge and current affairs. Short listed candidates from the entrance examination are required to take the Situation Test and Personal Interview as applicable (except B.F.Tech).
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PERSONAL INTERVIEWS (PI) – FOR MFM Programmes
Shortlisted candidates for Masters Programmes after the written entrance examination are required to undergo a Personal Interview (PI).
Candidates shall be evaluated on the various parameters as listed below by a panel, in the Personal Interview:
NIFT reserves the right to modify the entrance examination scheme including non-conduct of any stage(s) due to unforeseen circumstances.